Applications of High-Resolution Microscopy in Nanostructure Characterization

Abstract

High-resolution microscopy has revolutionized the characterization of nanostructures, enabling visualization, measurement, and manipulation at the atomic and molecular levels. Techniques such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), and scanning tunneling microscopy (STM) are essential tools in nanoscience for understanding the structure-property relationships in nanomaterials. This article explores the core applications of these techniques in nanostructure imaging, defect analysis, surface topography, chemical composition mapping, and in situ observations under external stimuli. Through a comparative analysis of their resolution capabilities and functionalities, this study highlights the critical role of microscopy in advancing nanotechnology research and development.